Infrared emissivity measurement methods considering target reflective characteristics

被引:0
|
作者
Liu, Yin [1 ]
Li, Yiwen [2 ]
Ma, Simin [1 ]
Zhang, Puyousen [2 ]
Li, Yao [2 ]
Fan, Xiumei [1 ]
Li, Weiqin [1 ]
机构
[1] Xian Univ Technol, Sch Automat & Informat Engn, Xian 710048, Peoples R China
[2] Air Force Engn Univ, Sci & Technol Plasma Dynam Lab, Xian 710038, Peoples R China
关键词
21;
D O I
10.1364/AO.535336
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Emissivity measurements are of great significance for infrared thermal radiation and infrared remote sensing. However, traditional methods often face challenges such as difficulties in non-contact measurement, small measurement areas, and unsuitability for non-Lambertian surfaces. To address these issues, we propose the reflective distribution model integral method (RDMIM). This method is based on a reflective distribution model using the scattering-reflective deviation angle (SRDA). By regressing and integrating the object's reflective distribution model, it achieves accurate non-contact measurement of non-Lambertian surfaces under normal temperature conditions. Additionally, the measurement scheme has been further optimized to improve measurement efficiency while ensuring the accuracy of the model regression. Finally, the proposed RDMIM method has been validated through experimental measurements. The results have shown that this method has advantages in non-contact and large-area measurements. Moreover, the systematic error is smaller when the reflective characteristics of the reference body and the target are relatively similar. (c) 2024 Optica Publishing Group. All rights, including for text and data mining (TDM), Artificial Intelligence (AI) training, and similar technologies, are reserved.
引用
收藏
页码:8180 / 8188
页数:9
相关论文
共 50 条
  • [31] Uncertainty Analysis for Emissivity Measurement at Elevated Temperatures with an Infrared Camera
    Dragana Höser
    R. Wallimann
    Ph. Rudolf von Rohr
    International Journal of Thermophysics, 2016, 37
  • [32] Accurate measurement of object emissivity using infrared imaging technique
    Hou, Chenggang
    Zhang, Guangming
    Zhao, Mingtao
    Qu, Liangsheng
    Hongwai Yu Haomibo Xuebao/Journal of Infrared and Millimeter Waves, 1997, 16 (03): : 193 - 198
  • [33] Dynamic measurement of reflectance/emissivity in mid-infrared band
    Zhang Tian-yu
    Chen Min-sun
    Zhang Xiang-yu
    Jiang Hou-man
    HIGH-POWER LASERS AND APPLICATIONS VIII, 2016, 10016
  • [34] MEASUREMENT OF ANGULAR EMISSIVITY BY REFLECTION IN THERMAL INFRARED - IMPLICATIONS FOR TELEDETECTION
    BECKER, F
    NERRY, F
    RAMANANTSIZEHENA, P
    STOLL, MP
    INTERNATIONAL JOURNAL OF REMOTE SENSING, 1986, 7 (12) : 1751 - 1762
  • [35] Emissivity corrected infrared temperature measurement, fundamentals of radiation flow
    Tank, V.
    Dietl, H.
    Infrared Physics, 1991, 31 (05):
  • [36] METHODS OF MEASURING INFRARED RADIATION WITH EFFECT OF SURFACE EMISSIVITY ELIMINATED
    VLASOV, NI
    KAPLAN, ML
    MEASUREMENT TECHNIQUES, 1975, 18 (12) : 1785 - 1787
  • [37] Evaluation of Wall Paint Emissivity During Infrared Thermography Temperature Measurement
    Lerantzis, P. I.
    Kontogiannis, N. V.
    Tsarabaris, P. T.
    Theodorou, N. J.
    MATERIALS AND APPLICATIONS FOR SENSORS AND TRANSDUCERS, 2012, 495 : 148 - 150
  • [38] Measurement of spectral directional emissivity of materials and coatings in the infrared region of spectrum
    Vitkovskii V.V.
    Gorshenev V.G.
    Potapov Yu.F.
    Thermal Engineering, 2009, 56 (03) : 245 - 248
  • [39] Evaluation of Wall Paint Emissivity During Infrared Thermography Temperature Measurement
    Lerantzis, P. I.
    Kontogiannis, N. V.
    Tsarabaris, P. T.
    Theodorou, N. J.
    SENSOR LETTERS, 2013, 11 (02) : 311 - 313
  • [40] MEASUREMENT AND SPATIAL VARIATION OF THERMAL INFRARED SURFACE EMISSIVITY IN A SAVANNA ENVIRONMENT
    VANDEGRIEND, AA
    OWE, M
    GROEN, M
    STOLL, MP
    WATER RESOURCES RESEARCH, 1991, 27 (03) : 371 - 379