AI CNN Based Defect Inspection System of a Governor Using a Rotating Platform

被引:0
|
作者
Kim, Dong Hun [1 ]
Jeong, Jong Min [2 ]
机构
[1] Department of Electronics Engineering, Kyungnam University, Korea, Republic of
[2] Department of Mechatronics Engineering, Kyungnam University, Korea, Republic of
关键词
Convolutional neural networks - Inspection equipment - Rotating machinery;
D O I
10.5302/J.ICROS.2024.24.0162
中图分类号
学科分类号
摘要
引用
收藏
页码:1082 / 1089
相关论文
共 50 条
  • [21] Automatic defect inspection system of colour filters using Taguchi-based neural network
    Kuo, Chung-Feng
    Hsu, Chien-Tung Max
    Fang, Chih-Heng
    Chao, Shin-Min
    Lin, Yu-De
    INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH, 2013, 51 (05) : 1464 - 1476
  • [22] Automatic defect detection of metro tunnel surfaces using a vision-based inspection system
    Li, Dawei
    Xie, Qian
    Gong, Xiaoxi
    Yu, Zhenghao
    Xu, Jinxuan
    Sun, Yangxing
    Wang, Jun
    ADVANCED ENGINEERING INFORMATICS, 2021, 47
  • [23] Design and Implementation of Inspection System for Lift Based on Android Platform
    Zhang, Yan
    Hu, Yanping
    PROCEEDINGS OF THE 2016 2ND WORKSHOP ON ADVANCED RESEARCH AND TECHNOLOGY IN INDUSTRY APPLICATIONS, 2016, 81 : 1661 - 1666
  • [25] Native pattern defect inspection of EUV mask using advanced electron beam inspection system
    Shimomura, Takeya
    Inazuki, Yuichi
    Abe, Tsukasa
    Takikawa, Tadahiko
    Mohri, Hiroshi
    Hayashi, Naoya
    Wang, Fei
    Ma, Long
    Zhao, Yan
    Kuan, Chiyan
    Xiao, Hong
    Jau, Jack
    PHOTOMASK TECHNOLOGY 2010, 2010, 7823
  • [26] Intelligence Defect Detection of the Water Wall in Boiler System Based on CNN
    Wang, Yuwei
    Lu, Li
    Zhang, Yu
    Ding, Yongsan
    Yang, Jia
    Lv, Yishi
    Ma, Bo
    Lin, Xiaoyong
    PROCEEDINGS OF 2020 IEEE 9TH DATA DRIVEN CONTROL AND LEARNING SYSTEMS CONFERENCE (DDCLS'20), 2020, : 639 - 644
  • [27] A CNN-Based Defect Inspection Method for Catenary Split Pins in High-Speed Railway
    Zhong, Junping
    Liu, Zhigang
    Han, Zhiwei
    Han, Ye
    Zhang, Wenxuan
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2019, 68 (08) : 2849 - 2860
  • [28] Improvement of a Visual-based Anthropometry Measurement System using Microsoft Kinect and a Rotating Platform
    Wahid, Mohd Faiz
    Kamat, Seri Rahayu
    Shamsuddin, Syamimi
    Hambali, Ruzy Haryati
    Saad, Mohamad Hanif Md
    PROCEEDINGS OF INNOVATIVE RESEARCH AND INDUSTRIAL DIALOGUE 2018 (IRID'18), 2019, : 230 - 231
  • [29] The analysis of EUV mask defects using a wafer defect inspection system
    Cho, Kyoung-Yong
    Park, Joo-On
    Park, Changmin
    Lee, Young-Mi
    Kang, In-Yong
    Yeo, Jeong-Ho
    Choi, Seong-Woon
    Park, Chan-Hoon
    Lange, Steven R.
    Cho, SungChan
    Danen, Robert M.
    Kirk, Gregory L.
    Pae, Yeon-Ho
    EXTREME ULTRAVIOLET (EUV) LITHOGRAPHY, 2010, 7636
  • [30] DEVELOPMENT OF DEFECT INSPECTION SYSTEM USING MAGNETIC-TAPE METHOD
    NONAKA, K
    SEKINE, K
    HATSUKANO, K
    JOURNAL OF MECHANICAL ENGINEERING LABORATORY, 1991, 45 (04): : 204 - 210