YOLO Based Crack Detection of Structures with Edge Detection Process

被引：0
|
作者：
Kim, Ji-Soo [1 ]
Chung, Kyungyong [1 ]
机构：
[1] Division of AI Computer Science and Engineering, Kyonggi University, Korea, Republic of
来源：
Transactions of the Korean Institute of Electrical Engineers | 2024年 / 73卷 / 12期
关键词：
D O I：
10.5370/KIEE.2024.73.12.2391
中图分类号：
学科分类号：
摘要：
13
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收藏
页码：2391 / 2397
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