Application of JTAG Boundary Scan to Embedded System Development

被引：0
|
作者：
Naitou R. [1 ]
机构：
[1] Tokushu Denshi Kairo Inc, Arca Central 14F, 1-2-1 Kinshi, Sumida-ku, Tokyo
来源：
Journal of Japan Institute of Electronics Packaging | 2024年 / 27卷 / 04期
关键词：
D O I：
10.5104/jiep.27.306
中图分类号：
学科分类号：
摘要：
[No abstract available]
引用
收藏
页码：306 / 314
页数：8
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