Application of JTAG Boundary Scan to Embedded System Development

被引：0

|

作者：

Naitou R. ^{[1
]}

机构：

[1] Tokushu Denshi Kairo Inc, Arca Central 14F, 1-2-1 Kinshi, Sumida-ku, Tokyo

来源：

Journal of Japan Institute of Electronics Packaging | 2024年 / 27卷 / 04期

关键词：

D O I：

10.5104/jiep.27.306

中图分类号：

学科分类号：

摘要：

[No abstract available]

引用

收藏

页码：306 / 314

页数：8

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