共 50 条
- [41] Defect engineering of Czochralski single-crystal silicon MATERIALS SCIENCE & ENGINEERING R-REPORTS, 2000, 28 (5-6): : 149 - 198
- [42] Point defect engineering in preamorphized silicon enriched with fluorine NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2006, 253 (1-2): : 94 - 99
- [44] Application of defect engineering to silicon Raman lasers and amplifiers Journal of Materials Science: Materials in Electronics, 2009, 20 : 48 - 53
- [47] Defect-Induced Surface Morphological Evolution in Epitaxial Germanium Growth on Silicon SIGE, GE, AND RELATED COMPOUNDS 4: MATERIALS, PROCESSING, AND DEVICES, 2010, 33 (06): : 1015 - 1019
- [48] Non destructive electrical defect characterisation and topography of silicon wafers and epitaxial layers SEMICONDUCTOR DEFECT ENGINEERING-MATERIALS, SYNTHETIC STRUCTURES AND DEVICES, 2005, 864 : 549 - 554
- [49] Effect of proton fluence on point defect formation in epitaxial silicon for radiation detectors NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2005, 552 (1-2): : 71 - 76