共 50 条
- [4] POINT-DEFECT ENGINEERING APPLIED TO SHALLOW JUNCTION ULSI PROCESSING ION BEAM PROCESSING OF ADVANCED ELECTRONIC MATERIALS, 1989, 147 : 3 - 12
- [5] Defect engineering for silicon microphotonics PROCEEDINGS OF THE THIRD INTERNATIONAL SYMPOSIUM ON DEFECTS IN SILICON, 1999, 99 (01): : 215 - 224
- [6] GROWTH MECHANISM AND DEFECT STRUCTURES IN EPITAXIAL SILICON PHILOSOPHICAL MAGAZINE, 1962, 7 (83): : 1847 - &
- [10] STUDY OF DEFECT FORMATION IN SILICON REVERSED EPITAXIAL STRUCTURES UKRAINSKII FIZICHESKII ZHURNAL, 1993, 38 (10): : 1517 - 1521