DC POTENTIAL DROP TECHNIQUE IN CREEP STRESS RUPTURE TESTING.

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作者：
Vasatis, Ioannis P. [1 ]
Pelloux, Regis M. [1 ]
机构：
[1] MIT, Dep of Materials Science &, Engineering, Cambridge, MA, USA, MIT, Dep of Materials Science & Engineering, Cambridge, MA, USA
来源：
| 1600年 / 37期
关键词：
CRACK PROPAGATION - DC POTENTIAL DROP TECHNIQUE - STRESS RUPTURE - U NOTCH - V NOTCH;
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(Edited Abstract)
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