共 45 条
- [31] A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY, 2017, 92 (5-8): : 1967 - 1977
- [32] A digital metrology process model (MPM) for measuring planning and data analysis and its application with a computer-aided system The International Journal of Advanced Manufacturing Technology, 2017, 92 : 1967 - 1977
- [35] POSSIBILITIES FOR THE EARLY DETECTION OF DISEASE USING AUTOMATED DATA-PROCESSING OF DIFFERENT PHYSIOLOGICAL-PARAMETERS WITH THE AID OF COMPUTER-AIDED SYSTEMS LANDBAUFORSCHUNG VOLKENRODE, 1985, : 170 - 185
- [36] Fault-Tolerant Computer-Aided Control Systems with Multiversion-Threshold Adaptation: Adaptation Methods, Reliability Estimation, and Choice of an Architecture Automation and Remote Control, 2002, 63 : 991 - 1003
- [38] Optimal control of sampled-data piecewise affine systems and its application to CPU processing control 42ND IEEE CONFERENCE ON DECISION AND CONTROL, VOLS 1-6, PROCEEDINGS, 2003, : 161 - 166
- [40] Efficient computer-aided simulation approach of switched-mode power conversion circuits and systems with digital control implementation and its practical applications PESC'97: 28TH ANNUAL IEEE POWER ELECTRONICS SPECIALISTS CONFERENCE - RECORD, VOLS I AND II, 1997, : 908 - 915