Peculiarities of two-frequency testing method

被引：0
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作者：
Zybov, V.N. [1 ]
机构：
[1] Fiziko-Mekhanicheskij Inst., NAN Ukrainy, L'vov, Ukraine
来源：
Defektoskopiya | 2002年 / 05期
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摘要：
(Edited Abstract)
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页码：63 / 73
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