High-resolution analysis of semiconductor surface phonons by Raman spectroscopy

被引：0
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作者：
Esser, N. [1 ]
Hinrichs, K. [1 ]
Power, J.R. [1 ]
Richter, W. [1 ]
机构：
[1] Inst. für Festkörperphysik, TU. Berlin, Hardenbergstr. 36, D., Berlin, Germany
来源：
Surface Science | 1999年 / 427-428卷
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页码：44 / 52
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