Carbon nanotubes as tips for atomic force microscopy

被引:0
|
作者
Guo, Li-Qiu [1 ,2 ]
Xu, Zong-Wei [1 ]
Zhao, Tie-Qiang [1 ]
Zhao, Qing-Liang [1 ]
Zhang, Fei-Hu [1 ]
Dong, Shen [1 ]
机构
[1] Precision Eng. Res. Inst., Harbin Inst. of Technol., Harbin 150001, China
[2] Sch. of Mech. Eng., Tsinghua Univ., Beijing 100084, China
关键词
D O I
暂无
中图分类号
学科分类号
摘要
Carbon nanotubes
引用
收藏
页码:223 / 227
相关论文
共 50 条
  • [41] Effective Stiffness of Hydrated Atomic Force Microscopy Tips
    Davis, Solomon
    Sivan, Uri
    NANO LETTERS, 2022, 22 (16) : 6732 - 6736
  • [42] In Situ Reproducible Sharp Tips for Atomic Force Microscopy
    Onoda, Jo
    Hasegawa, Tsuyoshi
    Sugimoto, Yoshiaki
    PHYSICAL REVIEW APPLIED, 2021, 15 (03)
  • [44] GaN nanowire tips for nanoscale atomic force microscopy
    Behzadirad, Mahmoud
    Nami, Mohsen
    Rishinaramagalam, Ashwin K.
    Feezell, Daniel F.
    Busani, Tito
    NANOTECHNOLOGY, 2017, 28 (20)
  • [45] Combination of atomic force microscopy and photoluminescence microscopy for the investigation of individual carbon nanotubes on sapphire surfaces
    Jester, Stefan-Sven
    Kiowski, Oliver
    Lebedkin, Sergei
    Hennrich, Frank
    Fischer, Regina
    Stuerzl, Ninette
    Hawecker, Jacques
    Kappes, Manfred M.
    PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 2007, 244 (11): : 3973 - 3977
  • [46] Atomic force microscopy imaging and cutting of beaded carbon nanotubes deposited on glass
    Singjai, P
    Songmee, N
    Tunkasiri, T
    Vilaithong, T
    SURFACE AND INTERFACE ANALYSIS, 2002, 33 (10-11) : 900 - 904
  • [47] SINGLE-SHELL CARBON NANOTUBES IMAGED BY ATOMIC-FORCE MICROSCOPY
    HOPER, R
    WORKMAN, RK
    CHEN, D
    SARID, D
    YADAV, T
    WITHERS, JC
    LOUTFY, RO
    SURFACE SCIENCE, 1994, 311 (03) : L731 - L736
  • [48] Atomic force and optical microscopy characterization of the deformation of individual carbon nanotubes and nanofibers
    Bigioni, Terry P.
    Cruden, Brett A.
    JOURNAL OF NANOMATERIALS, 2008, 2008
  • [49] Geometric characterization of carbon nanotubes by atomic force microscopy in conjunction with a tip characterizer
    Wang, Chunmei
    Itoh, Hiroshi
    Homma, Yoshikazu
    Sun, Jielin
    Hu, Jun
    Ichimura, Shingo
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (07) : 6128 - 6133
  • [50] Robust operation and performance of integrated carbon nanotubes atomic force microscopy probes
    Rius, G.
    Clark, I. T.
    Yoshimura, M.
    15TH INTERNATIONAL CONFERENCE ON THIN FILMS (ICTF-15), 2013, 417