LOW-FREQUENCY NOISE SPECTRA IN MOSFETS MADE BY THE DMOS PROCESS.

被引：1
|
作者：
Zhu, X.C. [1 ]
van der Ziel, A. [1 ]
Duh, K.H. [1 ]
机构：
[1] Univ of Minnesota, Electrical, Engineering Dep, Minneapolis, MN,, USA, Univ of Minnesota, Electrical Engineering Dep, Minneapolis, MN, USA
来源：
Solid-State Electronics | 1985年 / 28卷 / 04期
关键词：
D O I：
10.1016/0038-1101(85)90092-9
中图分类号：
学科分类号：
摘要：
6
引用
收藏
页码：325 / 328
相关论文
共 50 条
  • [31] Impact of the device scaling on the low-frequency noise in n-MOSFETs
    H.M. Bu
    Y. Shi
    X.L. Yuan
    Y.D. Zheng
    S.H. Gu
    H. Majima
    H. Ishikuro
    T. Hiramoto
    Applied Physics A, 2000, 71 (2) : 133 - 136
  • [32] LOW-FREQUENCY NOISE CHARACTERISTICS OF LIGHTLY-DOPED-DRAIN MOSFETS
    JANG, SL
    CHANG, PC
    SOLID-STATE ELECTRONICS, 1993, 36 (07) : 1007 - 1010
  • [33] Impact of interfacial layer on low-frequency noise of HfSiON dielectric MOSFETs
    Min, Bigang
    Devireddy, Siva Prasad
    Celik-Butler, Zeynep
    Shanware, Ajit
    Colombo, Luigi
    Green, Keith
    Chambers, J. J.
    Visokay, M. R.
    Rotondaro, Antonio Luis Pacheco
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2006, 53 (06) : 1459 - 1466
  • [34] Reduction of Low-Frequency Noise in Si MOSFETs by Using Nanowire Channel
    Ohmori, K.
    Feng, W.
    Hettiarachchi, R.
    Lee, Y.
    Sato, S.
    Kakushima, K.
    Sato, M.
    Fukuda, K.
    Niwa, M.
    Yamabe, K.
    Shiraishi, K.
    Iwai, H.
    Yamada, K.
    2012 IEEE 11TH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT-2012), 2012, : 13 - 16
  • [35] LOW-FREQUENCY NOISE IN 100 NM N-MOSFETS AT LOW-TEMPERATURES
    SHI, ZM
    MIEVILLE, JP
    BARRIER, J
    DUTOIT, M
    MICROELECTRONIC ENGINEERING, 1991, 15 (1-4) : 543 - 546
  • [36] SILICON PREOXIDIZING ETCHING PROCESS EFFECT ON LOW-FREQUENCY PROCESS EFFECT ON LOW-FREQUENCY NOISE IN MOS STRUCTURES
    ZHIGALSKIJ, GP
    PUTRYA, MG
    FEDOROV, AS
    IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII RADIOFIZIKA, 1989, 32 (09): : 1158 - 1165
  • [37] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
    da Silva, Mauricio Banaszeski
    Tuinhout, Hans P.
    Zegers-van Duijnhoven, Adrie
    Wirth, Gilson I.
    Scholten, Andries J.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2017, 64 (08) : 3331 - 3336
  • [38] Low-frequency noise characterization of gate oxide trap depth distribution of MOSFETs
    Chen, Hua
    Zhang, Yanjun
    He, Liang
    APPLIED PHYSICS LETTERS, 2023, 122 (22)
  • [39] Low-frequency noise in high-k gate dielectric nanoscale MOSFETs
    Han, I. K.
    Nam, H. D.
    Choi, W. J.
    Lee, J. I.
    Szentpali, B.
    Chovet, A.
    JOURNAL OF THE KOREAN PHYSICAL SOCIETY, 2006, 49 (03) : 1117 - 1120
  • [40] Low-Frequency Noise Sources in Advanced UTBB FD-SOI MOSFETs
    Theodorou, Christoforos G.
    Ioannidis, Eleftherios G.
    Andrieu, Francois
    Poiroux, Thierry
    Faynot, Olivier
    Dimitriadis, Charalabos A.
    Ghibaudo, Gerard
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2014, 61 (04) : 1161 - 1167
12345