Extended synchrotron X-ray reflectivity study of a Sm-based layer buried into CdTe(001)

被引：0
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作者：
Boudet, N. [1 ]
Eymery, J. [1 ]
Renaud, G. [1 ]
Rouviere, J.L. [1 ]
Veuillen, J.Y. [1 ]
Brun, D. [1 ]
Daudin, B. [1 ]
机构：
[1] CEA, Grenoble, France
来源：
| 1600年 / Elsevier Science B.V., Amsterdam, Netherlands卷 / 327期
关键词：
701.1 Electricity: Basic Concepts and Phenomena - 712.1.2 Compound Semiconducting Materials - 741.3 Optical Devices and Systems - 804.2 Inorganic Compounds - 931.2 Physical Properties of Gases; Liquids and Solids - 933.1.2 Crystal Growth;
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摘要：
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