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- [34] Spatial Signature in Local Overlay Measurements - "What CD-SEM can tell us and Optical Measurements Can Not" METROLOGY, INSPECTION, AND PROCESS CONTROL FOR MICROLITHOGRAPHY XXIV, 2010, 7638
- [38] What Can Developers' Messages Tell Us? 2013 22ND AUSTRALASIAN CONFERENCE ON SOFTWARE ENGINEERING (ASWEC), 2013, : 107 - 116