Low-angle X-ray diffraction of multilayered structures

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[1] Vanderstraeten, H.

[2] Neerinck, D.

[3] Temst, K.

[4] Bruynseraede, Y.

[5] Fullerton, Eric E.

[6] Schuller, Ivan K.

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Vanderstraeten, H. | 1600年 / 24期

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