Temperature-dependent surface properties of thin polystyrene films determined by scanning force microscopy

被引:0
|
作者
Marti, Othmar [1 ]
Hild, Sabine [1 ]
机构
[1] Experimental Physics, University of Ulm, D-89069 Ulm, Germany
来源
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
页码:212 / 226
相关论文
共 50 条
  • [21] Temperature-Dependent Optical Properties of Plasmonic Titanium Nitride Thin Films
    Reddy, Harsha
    Guler, Urcan
    Kudyshev, Zhaxylyk
    Kildishev, Alexander V.
    Shalaev, Vladimir M.
    Boltasseva, Alexandra
    ACS PHOTONICS, 2017, 4 (06): : 1413 - 1420
  • [22] Substrate temperature-dependent properties of sprayed cobalt oxide thin films
    Kouidri, Nabila
    Rahmane, Saad
    Allag, Abdelkrim
    JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS, 2019, 30 (02) : 1153 - 1160
  • [23] Effect of roughness as determined by atomic force microscopy on the wetting properties of PTFE thin films
    Miller, JD
    Veeramasuneni, S
    Drelich, J
    Yalamanchili, MR
    Yamauchi, G
    POLYMER ENGINEERING AND SCIENCE, 1996, 36 (14): : 1849 - 1855
  • [24] TEMPERATURE-DEPENDENT SURFACE MAGNETIZATION AND CRITICAL-TEMPERATURE OF FERROMAGNETIC THIN-FILMS
    HUNG, DT
    PHYSICA STATUS SOLIDI B-BASIC RESEARCH, 1981, 103 (02): : 809 - 815
  • [25] Surface heterogeneity of polystyrene latex particles determined by dynamic force microscopy
    Tan, SS
    Sherman, RL
    Qin, DQ
    Ford, WT
    LANGMUIR, 2005, 21 (01) : 43 - 49
  • [26] Bath temperature-dependent structural properties, coercive force, surface morphology and surface texture of electrochemically grown nanostructured Ni-Co/ITO thin films
    Sarac, Umut
    Kaya, Malik
    Baykul, M. Celalettin
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2020, 126 (03):
  • [27] OBSERVATION OF TEMPERATURE-DEPENDENT THICKNESSES IN ULTRATHIN POLYSTYRENE FILMS ON SILICON
    ORTS, WJ
    VANZANTEN, JH
    WU, WL
    SATIJA, SK
    PHYSICAL REVIEW LETTERS, 1993, 71 (06) : 867 - 870
  • [28] SURFACE TEMPERATURE WITH TEMPERATURE-DEPENDENT THERMAL PROPERTIES
    LING, FF
    RICE, JS
    ASLE TRANSACTIONS, 1966, 9 (02): : 195 - +
  • [29] Temperature-dependent magnetism in transition metal films observed by magnetic force microscopy and classical magnetometry
    Soh, YA
    Aeppli, G
    JOURNAL OF APPLIED PHYSICS, 1999, 85 (08) : 4607 - 4609
  • [30] Nanostructuring and hardness investigations of thin films by scanning force microscopy
    Nowicki, M
    Richter, A
    Ries, R
    Oszwaldowski, M
    ACTA PHYSICA POLONICA A, 1998, 93 (02) : 437 - 441