共 50 条
- [32] Modern Scanning Electron Microscopy. 1. Secondary Electron Emission JOURNAL OF SURFACE INVESTIGATION, 2023, 17 (03): : 598 - 611
- [34] Modern Scanning Electron Microscopy. 1. Secondary Electron Emission Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques, 2023, 17 : 598 - 611
- [36] PRODUCTION OF THIN SILICON CRYSTALS FOR TRANSMISSION ELECTRON MICROSCOPY. Instruments and experimental techniques New York, 1984, 27 (2 pt 2): : 502 - 504
- [38] Ultrasonic Method for the Preparation of Microspecimens for Transmission Electron Microscopy. Praktische Metallographie/Practical Metallography, 1978, 15 (09): : 441 - 448