共 50 条
- [41] Study of the roughness and optical near field of mass surface by using a SNOM with shear-force regulation OPTICAL MICRO- AND NANOMETROLOGY IN MANUFACTURING TECHNOLOGY, 2004, 5458 : 171 - 182
- [46] NEAR-FIELD SCANNING OPTICAL MICROSCOPE WITH A LASER TRAPPED PROBE JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1994, 33 (12A): : L1725 - L1727
- [48] Image resolution in reflection scanning near-field optical microscopy using shear-force feedback: Characterization with a spline and Fourier spectrum APPLIED OPTICS, 1997, 36 (10): : 2171 - 2177