Quantum factor correction for modelling the C-V characteristics of the MOS-SOI structure

被引：0

作者：

Badri, M. ^{[1
]}

Ikraiam, F.A. ^{[1
]}

Majkusiak, B. ^{[1
]}

Beck, R.B. ^{[1
]}

机构：

[1] Warsaw Univ of Technology, Warszawa, Poland

来源：

Electron Technology (Warsaw) | 1999年 / 32卷 / 01期

关键词：

D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：130 / 132

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