X-RAY TOPOGRAPHIC OBSERVATION OF SINGLE DISLOCATION MOBILITY IN SILICON.

被引：0
|
作者：
George, A.
Escaravage, C.
Schroeter, W.
Champier, G.
机构：
来源：
Crystal Lattice Defects | 1973年 / 4卷 / 01期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
SILICON AND ALLOYS
引用
收藏
页码：29 / 36
相关论文
共 50 条
  • [41] X-RAY SPECTROSCOPIC STUDY OF THE DISTRIBUTION OF GERMANIUM IONS IMPLANTED IN SILICON.
    SAL'MAN, V.M.
    KISELEVA, K.V.
    KRASNOPEVTSEV, V.V.
    KHUSAINOV, R.SH.
    1981, (N 7): : 14 - 17
  • [42] X-RAY TOPOGRAPHIC INVESTIGATIONS OF LARGE OXYGEN PRECIPITATES IN SILICON
    Wierzchowski, W. K.
    Wieteska, K.
    Graeff, W.
    Pawlowska, M.
    Surma, B.
    ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES, 2002, 58 : C172 - C172
  • [43] X-ray topographic investigation of large oxygen precipitates in silicon
    Wierzchowski, W
    Wieteska, K
    Graeff, W
    Pawlowska, M
    Surma, B
    Strzelecka, S
    JOURNAL OF ALLOYS AND COMPOUNDS, 2004, 362 (1-2) : 301 - 306
  • [44] TOPOGRAPHIC STUDIES OF AN X-RAY INTERFEROMETER OF CZOCHRALSKI-SILICON
    DIETRICH, B
    KITTNER, R
    ZAUMSEIL, P
    GROSSWIG, S
    KRISTALL UND TECHNIK-CRYSTAL RESEARCH AND TECHNOLOGY, 1980, 15 (08): : 933 - 936
  • [45] AN X-RAY TOPOGRAPHIC STUDY OF D-DEFECTS IN SILICON
    VYSOTSKAYA, VV
    GORIN, SN
    SOROKIN, LM
    SHEIKHET, EG
    FIZIKA TVERDOGO TELA, 1987, 29 (06): : 1858 - 1861
  • [46] X-RAY TOPOGRAPHIC STUDIES OF COPPER PRECIPITATION BEHAVIOR ON DISLOCATIONS IN SILICON SINGLE-CRYSTALS
    TOMIMITSU, H
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1976, 40 (02) : 505 - 512
  • [47] X-ray scattering topographic observation of ZnSe and ZnTe bulk crystals
    Shinbara, M
    Suzuki, Y
    Chikaura, Y
    Kii, H
    JOURNAL OF CRYSTAL GROWTH, 2000, 210 (1-3) : 187 - 192
  • [48] X-ray topographic observation of magnetic domain structures induced by stresses
    Polcarová, M
    Brádler, J
    Tomás, I
    Jacques, A
    Georges, A
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 1999, 357 (1761): : 2689 - 2700
  • [49] X-RAY TOPOGRAPHIC OBSERVATION OF IMPERFECTION IN AT CUT SYNTHETIC QUARTZ PLATE
    郭常霖
    黄月鸿
    苏留焕
    A Monthly Journal of Science, 1981, (05) : 424 - 429
  • [50] X-RAY TOPOGRAPHIC OBSERVATION ON THE ANNEALING PROCESS OF PURE IRON CRYSTAL
    MIHARA, A
    TANEDA, Y
    JOURNAL OF MATERIALS SCIENCE, 1992, 27 (24) : 6695 - 6699
12345