Studying the effects of organic contaminants on the head/disk interface with a new test system

被引：0
|
作者：
Koka, Ramesh [1 ]
机构：
[1] formerly of IBM-Adstar, Rochester, United States
来源：
Microcontamination | 1993年 / 11卷 / 09期
关键词：
10;
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摘要：
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页码：41 / 46
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