Analyses of stacking fault density in Co-alloy thin films by high-resolution transmission electron microscopy

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Hitachi, Ltd, Kanagawa, Japan [1 ]
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IEEE Trans Magn | / 5 pt 1卷 / 3605-3607期
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The authors thank T.P. Nolan; T; Ito; M.R. Visokay a d G.A. Bertero of Stanford University for their helpful assistance in TEM operation and discussion. We also acknowledge E. Mangyo and T. Yamamoto of Hitashi; Ltd. for the sample preparation;
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