机构:
Philips Test & Measurement, Enschede, Neth, Philips Test & Measurement, Enschede, NethPhilips Test & Measurement, Enschede, Neth, Philips Test & Measurement, Enschede, Neth
Bilterijst, Jan
[1
]
van Gorsel, Jan
论文数: 0引用数: 0
h-index: 0
机构:
Philips Test & Measurement, Enschede, Neth, Philips Test & Measurement, Enschede, NethPhilips Test & Measurement, Enschede, Neth, Philips Test & Measurement, Enschede, Neth
van Gorsel, Jan
[1
]
机构:
[1] Philips Test & Measurement, Enschede, Neth, Philips Test & Measurement, Enschede, Neth
来源:
Electronic Packaging and Production
|
1987年
/
27卷
/
02期
关键词:
INTEGRATED CIRCUITS - Layout - OSCILLOSCOPES;
CATHODE RAY - Design;
D O I:
暂无
中图分类号:
学科分类号:
摘要:
Increasing the packaging density in electronic instruments requires matching the circuitry to the application while ensuring maximum reliability. This article discusses how maximum packaging density and reliable electrical performance was achieved by use of thin-film hybrids and surface-mounted discrete chip components.