Multiple design error diagnosis and correction in digital VLSI circuits

被引：0

作者：

Veneris, Andreas ^{[1
]}

Venkataraman, Srikanth ^{[1
]}

Hajj, Ibrahim N. ^{[1
]}

Fuchs, W.Kent ^{[1
]}

机构：

[1] Univ of Illinois, Urbana, United States

来源：

Proceedings of the IEEE VLSI Test Symposium | 1999年

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

VLSI circuits

引用

页码：58 / 63

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