Dynamic in situ diagnostics using high-energy ion beam analysis

被引：0
|
作者：
Moeller, W. [1 ]
Fukarek, W. [1 ]
Grigull, S. [1 ]
Kruse, O. [1 ]
Parascandola, S. [1 ]
机构：
[1] Inst of Ion Beam Physics and, Materials Research, Dresden, Germany
来源：
Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms | 1998年 / 136-138卷
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：1203 / 1211
相关论文
共 50 条
  • [41] In situ scanning tunneling microscope studies of high-energy, focused ion implantation of Ga into GaAs: Direct observation of ion beam profiles
    Jones, GAC
    Rose, PD
    Brown, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1998, 16 (04): : 2570 - 2573
  • [42] PROBE FOR MEASUREMENT OF ALBEDO ELECTRON FLUX IN A HIGH-ENERGY ION BEAM
    HUBACH, RA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1962, 33 (12): : 1353 - &
  • [43] LATERAL DISPERSION OF A HIGH-ENERGY ION BEAM IN A SCATTERING MEDIUM.
    Crouch, T.W.
    Gottlieb, J.J.
    1600,
  • [44] HIGH-ENERGY ION-BEAM MODIFICATION OF POLYMER-FILMS
    VENKATESAN, T
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR): : 461 - 467
  • [45] PROPAGATION OF A HIGH-ENERGY HEAVY-ION BEAM THROUGH MATTER
    HEINRICH, W
    RADIATION EFFECTS AND DEFECTS IN SOLIDS, 1979, 40 (03): : 167 - 171
  • [46] A novel high-energy ion-beam driver and its applications
    Takayama, Ken
    Shimosaki, Yoshito
    Iwashita, Taiki
    Dixit, Tanuja
    Nakamura, Eiji
    Arakida, Yoshio
    Kono, Tadaaki
    Sato, Hikaru
    Wake, Masayoshi
    Adachi, Toshikazu
    Tojyo, Eiki
    Inagaki, Shigeru
    Okazaki, Koji
    Kikuchi, Takashi
    TRANSACTIONS OF THE MATERIALS RESEARCH SOCIETY OF JAPAN, VOL 32, NO 4, 2007, 32 (04): : 861 - 864
  • [47] Fabrication of nanowires using high-energy ion beams
    Tsukuda, S
    Seki, S
    Tagawa, S
    Sugimoto, M
    Idesaki, A
    Tanaka, S
    Oshima, A
    JOURNAL OF PHYSICAL CHEMISTRY B, 2004, 108 (11): : 3407 - 3409
  • [48] In-situ analysis of crystallographic texture using high-energy X-rays
    Brokmeier, H. -G.
    Yi, S. B.
    Schwebke, B.
    Homeyer, J.
    ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 2007, : 159 - 164
  • [49] In-situ analysis of crystallographic textures using high-energy X-rays
    Brokmeier, H. -G.
    Yi, S.
    Homeyer, J.
    ARCHIVES OF METALLURGY AND MATERIALS, 2008, 53 (01) : 33 - 38
  • [50] HIGH-ENERGY ION MICROPROBES FOR SURFACE-ANALYSIS
    NOBILING, R
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1986, 14 (01): : 142 - 147
12345