Characterization of platinum-ruthenium electrodeposits using XRD, AES and XPS analysis

被引:0
|
作者
F.A.A. Universidad Nacional de, Santiago del Estero, Santiago del Estero, Argentina [1 ]
机构
来源
J Electroanal Chem | / 1-2卷 / 32-39期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] Characterization of Intercalated Smectites Using XRD Profile Analysis in the Low-Angle Region
    Daniel Janeba
    Pavla Čapková
    Zdeněk Weiss
    Henk Schenk
    Clays and Clay Minerals, 1998, 46 : 63 - 68
  • [42] Characterization of intercalated smectites using XRD profile analysis in the low-angle region
    Janeba, D
    Capkova, P
    Weiss, Z
    Schenk, H
    CLAYS AND CLAY MINERALS, 1998, 46 (01) : 63 - 68
  • [43] Characterization of titanium hydride films covered by nanoscale evaporated Au layers: ToF-SIMS, XPS and AES depth profile analysis
    Lisowski, W
    van den Berg, AHJ
    Leonard, D
    Mathieu, HJ
    SURFACE AND INTERFACE ANALYSIS, 2000, 29 (04) : 292 - 297
  • [44] Analysis of valence XPS and AES of C, N, O, and F-containing substances by DFT calculations using the model molecules
    Endo, Kazunaka
    Hyodo, Kenji
    Takaoka, Kazuchiyo
    Ida, Tomonori
    Shimada, Shingo
    Takagi, Yusuke
    Kurmaev, Ernst Z.
    CHEMICAL PHYSICS, 2015, 452 : 31 - 39
  • [45] Characterization of fatigued Al lines by means of SThM and XRD: Analysis using fast Fourier transform
    Szeloch, R. F.
    Janus, P.
    Serafinczuk, J.
    Szecowka, P. M.
    Jozwiak, G.
    MICROELECTRONICS RELIABILITY, 2012, 52 (04) : 711 - 717
  • [46] Characterization of structural changes of mechanically activated natural pyrite using XRD line profile analysis
    Pourghahramani, P.
    Akhgar, B. N.
    INTERNATIONAL JOURNAL OF MINERAL PROCESSING, 2015, 134 : 23 - 28
  • [47] Microstructural Characterization of Pyrite during Mechanical Activation by Using Rietveld and XRD Line Profile Analysis
    Akhgar, B. N.
    Pourghahramani, P.
    Proceedings of the 24th International Mining Congress and Exhibition of Turkey, IMCET 2015, 2015, : 1306 - 1310
  • [48] Characterization of surface oxides on water-atomized steel powder by XPS/AES depth profiling and nano-scale lateral surface analysis
    Chasoglou, D.
    Hryha, E.
    Norell, M.
    Nyborg, L.
    APPLIED SURFACE SCIENCE, 2013, 268 : 496 - 506
  • [49] Characterization of kaolinite intercalation compounds with benzylalkylammonium chlorides using XRD, TGA/DTA and CHNS elemental analysis
    Matusik, Jakub
    Klapyta, Zenon
    APPLIED CLAY SCIENCE, 2013, 83-84 : 433 - 440
  • [50] Correlation Between XRD Analysis and Mechanical Characterization Using Lens Manufactured Specimens Based on IoT Sensors
    Rao, Puttam Sreenivasa
    Srinath, A.
    Narayana, K. L.
    JOURNAL OF POLYMER & COMPOSITES, 2024, 12 (02) : 41 - 58