Arbitrary-precision signal generation for mixed-signal built-in-self-test

被引：0
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作者：
Haurie, Xavier [1 ]
Roberts, Gordon W. [1 ]
机构：
[1] Analog Devices Inc, Wilmington, United States
来源：
IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing | 1998年 / 45卷 / 11期
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页码：1425 / 1432
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