Performance of a focused-ion-beam implanter with tilt-writing function

被引:0
|
作者
机构
[1] Sawaragi, Hiroshi
[2] Manabe, Hironobu
[3] Kasahara, Haruo
[4] Aihara, Ryuso
[5] Nakamura, Kazuo
[6] Nihei, Fumiyuki
[7] Ochiai, Yukinori
[8] Matsui, Shinji
[9] Nozaki, Tadatoshi
来源
Sawaragi, Hiroshi | 1600年 / 28期
关键词
(Edited Abstract);
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [41] A Flowmeter with Piezoresistive Metal Layer Deposited with Focused-Ion-Beam System
    Choi, Dae Keun
    Lee, Sang Hoon
    INTEGRATED FERROELECTRICS, 2014, 157 (01) : 157 - 167
  • [42] Inelastic deformability of nanopillar by focused-ion-beam chemical vapor deposition
    Shibutani, Yoji
    Yoshioka, Toshiyuki
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2008, 26 (01): : 201 - 205
  • [43] Nanomechanical switch fabrication by focused-ion-beam chemical vapor deposition
    Morita, T
    Kondo, K
    Hoshino, T
    Kaito, T
    Fujita, J
    Ichihashi, T
    Ishida, M
    Ochiai, Y
    Tajima, T
    Matsui, S
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2004, 22 (06): : 3137 - 3142
  • [44] CALCULATION OF LOCAL TEMPERATURE RISE IN FOCUSED-ION-BEAM SAMPLE PREPARATION
    ISHITANI, T
    KAGA, H
    JOURNAL OF ELECTRON MICROSCOPY, 1995, 44 (05): : 331 - 336
  • [45] Nanoprocessing and nanofabrication of a structured polymer film by the focused-ion-beam technique
    Niihara, K
    Kaneko, T
    Suzuki, T
    Sato, Y
    Nishioka, H
    Nishikawa, Y
    Nishi, T
    Jinnai, H
    MACROMOLECULES, 2005, 38 (08) : 3048 - 3050
  • [46] Focused-ion-beam deposition for 3-D nanostructure fabrication
    Matsui, Shinji
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 257 : 758 - 764
  • [47] ENHANCED COLLIMATION IN NARROW CHANNELS FABRICATED BY FOCUSED-ION-BEAM IMPLANTATION
    BEVER, T
    HIRAYAMA, Y
    TARUCHA, S
    JOURNAL OF APPLIED PHYSICS, 1994, 75 (05) : 2477 - 2480
  • [48] Focused-ion-beam nanofabrication of near-infrared magnetic metamaterials
    Enkrich, C
    Pérez-Willard, R
    Gerthsen, D
    Zhou, JF
    Koschny, T
    Soukoulis, CM
    Wegener, M
    Linden, S
    ADVANCED MATERIALS, 2005, 17 (21) : 2547 - +
  • [49] Nanopatterning of a thin ferromagnetic CoFe film by focused-ion-beam irradiation
    McGrouther, D
    Chapman, JN
    APPLIED PHYSICS LETTERS, 2005, 87 (02)
  • [50] LOW-ABERRATION EINZEL LENS FOR A FOCUSED-ION-BEAM SYSTEM
    KURIHARA, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1985, 24 (02): : 225 - 230