Calculation of time dependence in thin films

被引：0
|
作者：
机构：
[1] Lyberatos, A.
[2] Chantrell, R.W.
[3] Hoare, A.
来源：
Lyberatos, A. | 1600年 / 26期
关键词：
Magnetic Materials;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] TEMPERATURE DEPENDENCE OF MOSSBAUER EFFECT IN THIN FILMS
    MOTOC, C
    CORCIOVE.A
    REVUE ROUMAINE DE PHYSIQUE, 1965, 10 (02): : 149 - +
  • [22] THICKNESS DEPENDENCE OF SIGMA OF THIN GERMANIUM FILMS
    JOHANNES.JS
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1974, 26 (01): : K53 - K55
  • [23] ON CURRENT DENSITY DEPENDENCE OF ELECTROMIGRATION IN THIN FILMS
    HOFMAN, GL
    BREITLIN.HM
    PROCEEDINGS OF THE INSTITUTE OF ELECTRICAL AND ELECTRONICS ENGINEERS, 1970, 58 (05): : 833 - &
  • [24] The temperature dependence of resistivity in thin metal films
    Marom, H
    Eizenberg, M
    JOURNAL OF APPLIED PHYSICS, 2004, 96 (06) : 3319 - 3323
  • [25] The temperature dependence of resistivity in thin metal films
    Marom, H.
    Eizenberg, M.
    Journal of Applied Physics, 2004, 96 (06): : 3319 - 3323
  • [26] THICKNESS DEPENDENCE OF BREAKDOWN FIELD IN THIN FILMS
    AGARWAL, VK
    SRIVASTAVA, VK
    THIN SOLID FILMS, 1971, 8 (05) : 377 - +
  • [27] Thickness dependence of microstructure in LaCaMnO thin films
    Gross, GM
    Razavi, FS
    Praus, RB
    Habermeier, HU
    JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 2000, 211 (1-3) : 22 - 27
  • [28] Thickness dependence of superconductivity for In/Mo thin films
    Makise, K.
    Nakamura, T.
    Shinozaki, B.
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 2009, 469 (15-20): : 1005 - 1008
  • [29] Dependence of wavefront errors on nonuniformity of thin films
    Qi, Hongji
    Zhu, Meiping
    Zhang, Weili
    Yi, Kui
    He, Hongbo
    Shao, Jianda
    CHINESE OPTICS LETTERS, 2012, 10 (01)
  • [30] Simulation of thickness dependence in ferroelectric thin films
    Li, KT
    Lo, VC
    SOLID STATE COMMUNICATIONS, 2004, 132 (01) : 49 - 54
12345