PHOTOCATHODE SURFACE-RESISTANCE DETERMINATION FOR BIPLANAR ELECTRON-OPTICAL DEVICES.

被引：0
|
作者：
Turovskii, L.A.
Krasnov, V.F.
机构：
来源：
Instruments and experimental techniques New York | 1983年 / 26卷 / 5 pt 2期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
ELECTROOPTICAL DEVICES
引用
收藏
页码：1186 / 1187
相关论文
共 50 条
  • [41] Influence of non-alignment of an electron-optical system of accumulated electron-beam devices on the signal value
    Lavrinovich, N.A.
    Izvestiya Vysshikh Uchebnykh Zavedenij. Radioelektronika, 1996, 39 (04): : 36 - 43
  • [42] Trajectory Analysis in a Gyrotron Electron-Optical System with Allowance for the Cathode Surface Roughness
    Louksha, O. I.
    Trofimov, P. A.
    Malkin, A. G.
    RADIOPHYSICS AND QUANTUM ELECTRONICS, 2022, 65 (03) : 209 - 218
  • [43] ELECTRON-OPTICAL METHODS FOR MEASUREMENT OF LOCAL MAGNETIC-FIELDS IN VIDEO-RECORDING DEVICES
    GUSEV, VN
    SPIVAK, GV
    RATMANSKII, LZ
    RAU, EI
    LUKYANOV, AE
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1972, 36 (09): : 1974 - +
  • [44] Simulating 3D electron-optical systems of microwave vacuum devices with shadow grids
    Golenitskiy, II
    Dukhina, NG
    Kushchevskaya, TP
    Saprynskaya, LA
    14th International Crimean Conference: Microwave & Telecommunication Technology, Conference Proceedings, 2004, : 222 - 224
  • [45] Laser cutting of grids from pyrolitic graphite for electron-optical systems of microwave range devices
    Konyushin, AV
    Sokolova, TN
    Ol'hovaja, OA
    APEDE 2004: INTERNATIONAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRON DEVICES ENGINEERING, CONFERENCE PROCEEDINGS, 2004, : 489 - 492
  • [46] DETERMINATION OF DYNAMIC-RANGE OF X-RAY EOT (ELECTRON-OPTICAL TRANSDUCERS)
    DASHEVSKII, BE
    MALYUTIN, AA
    MAKHMUTOV, RK
    PODVYAZNIKOV, VA
    CHEVOKIN, VK
    YAKUNIN, VS
    PISMA V ZHURNAL TEKHNICHESKOI FIZIKI, 1989, 15 (08): : 44 - 47
  • [47] SINGLE-CRYSTAL ALUMINATES - A NEW GENERATION OF SCINTILLATORS FOR SCANNING ELECTRON MICROSCOPES AND TRANSPARENT SCREENS IN ELECTRON OPTICAL DEVICES.
    Autrata, R.
    Schauer, P.
    Kvapil, Jos
    Kvapil, J.
    Scanning Electron Microscopy, 1983, v (pt 2) : 489 - 500
  • [48] METHOD OF CALCULATION AND PRODUCTION OF DIELECTRIC TUBES GOING THROUGH HIGH-FREQUENCY ELECTRON-OPTICAL DEVICES
    VASICHEV, BN
    ROZENFELD, LB
    CHERNOVASTOLJAROVA, EE
    MICHALTSOV, EP
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1992, 56 (03): : 153 - 157
  • [49] APPARATUS FOR AN INTEGRATED EVALUATION OF THE IMAGE QUALITY OF VISUAL ELECTRON-OPTICAL DEVICES, OPERATING AT LOW ILLUMINATION LEVELS
    MATSKOVSKAYA, YZ
    SAVENCHUK, NA
    EDELSHTEIN, YG
    SOVIET JOURNAL OF OPTICAL TECHNOLOGY, 1985, 52 (03): : 185 - 186
  • [50] Determination of limiting parameters of multiple-beam electron-optical systems for diagnostics of semiconductor structures
    V. V. Kaz’miruk
    T. N. Savitskaya
    Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 2009, 3 : 781 - 785
12345