Spatial versus temporal phase shifting in electronic speckle-pattern interferometry: Noise comparison in phase maps

被引：0
|
作者：
Burke, Jan [1 ]
Helmers, Heinz [1 ]
机构：
[1] Fachbereich 8-Physik, Carl von Ossietzky Univ. Oldenburg, Postfach 2503, D-26111 Oldenburg, Germany
来源：
Applied Optics | 2000年 / 39卷 / 25期
关键词：
Interferometry - Lighting - Speckle - Spurious signal noise;
D O I：
10.1364/ao.39.004598
中图分类号：
学科分类号：
摘要：
Temporal and spatial phase shifting in electronic speckle-pattern interferometry are compared quantitatively with respect to the quality of the resultant deformation phase maps. On the basis of an analysis of the noise in sawtooth fringes a figure of merit is defined and measured for various in-plane and out-of-plane sensitive electronic speckle-pattern interferometry configurations. Varying quantities like the object-illuminating intensity, the beam ratio, the speckle size and shape, and the fringe density allows characteristic behaviors of both phase-shifting methods to be explored. © 2000 Optical Society of America.
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页码：4598 / 4606
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