TRACE ELEMENT DETERMINATION USING SYNCHROTRON RADIATION.

被引：0
|
作者：
Giauque, Robert D. [1 ]
Jaklevic, Joseph M. [1 ]
Thompson, Albert C. [1 ]
机构：
[1] Lawrence Berkeley Lab, Berkeley, CA,, USA, Lawrence Berkeley Lab, Berkeley, CA, USA
来源：
Medical and Biological Engineering and Computing | 1986年 / 24卷 / 02期
关键词：
CHEMICAL ANALYSIS - Measurements - X-RAY ANALYSIS - Measurements;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
The use of synchrotron radiation for high sensitivity trace multielement X-ray fluorescence determinations is demonstrated. Experimental conditions that yield optimum sensitivity are described. Emphasis was placed on establishing calibration techniques and procedures that would yield accurate results with high precision for elements present at concentration levels less than 1 ppm. Comparison of determined and listed elemental concentration values for five reference materials is given.
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页码：940 / 944
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