Testability and test generation for majority voting fault-tolerant circuits

被引：0
|
作者：
Stroud, Charles E. [1 ]
Barbour, Ahmed E. [1 ]
机构：
[1] AT&T Bell Lab, Naperville, United States
来源：
Journal of Electronic Testing: Theory and Applications (JETTA) | 1993年 / 4卷 / 03期
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18;
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页码：201 / 214
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