Microanalysis and Depth Profile Analysis by Auger Electron Spectroscopy.

被引：0

作者：

Dudek, H.J. ^{[1
]}

机构：

[1] DFVLR, Institut für Werkstoff-Forschung, Linder Höhe, D-5000 Köln 90, Germany

来源：

TM. Technisches Messen | 1987年 / 54卷 / 09期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

引用

页码：330 / 336

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