Raman characterization of high temperature materials using an imaging detector

The characterization of materials by Raman spectroscopy has been advanced by recent technological developments in light dectectors. Imaging photomultiplier-tube detectors are now available that impart position information in two dimensions while retaining photon-counting sensitivity, effectively greatly reducing noise. The combination of sensitivity and reduced noise allows smaller amounts of materials to be analyzed. The ability to observe small amounts of material when coupled with position information makes possible Raman characterization in which many spatial elements are analyzed simultaneously. Raman spectroscopy making use of these capabilities has been used, for instance, to analyze the phases present in carbon films and fibers and to map phase-transformed zones accompanying crack propagation in toughened zirconia ceramics.