Improved reliability of bistable circuits by selective hot-carrier stress reduction

被引：0
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作者：
Das, A.G.M. [1 ]
Johnson, S. [1 ]
机构：
[1] Medical Univ of Southern Africa, Medunsa, South Africa
来源：
Microelectronics Reliability | 1998年 / 38卷 / 6-8期
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摘要：
6
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页码：1177 / 1182
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