Improved reliability of bistable circuits by selective hot-carrier stress reduction

被引：0

作者：

Das, A.G.M. ^{[1
]}

Johnson, S. ^{[1
]}

机构：

[1] Medical Univ of Southern Africa, Medunsa, South Africa

来源：

Microelectronics Reliability | 1998年 / 38卷 / 6-8期

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D O I：

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中图分类号：

学科分类号：

摘要：

引用

页码：1177 / 1182

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