Scaling behavior of local magnetic relaxation in high-temperature superconductors

被引：0
|
作者：
Wei, C.D. [1 ]
Du, S.F. [1 ]
机构：
[1] Peking Univ, Beijing, China
来源：
| / Elsevier Science Ltd, Oxford, United Kingdom卷 / 104期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] SPIN SUSCEPTIBILITY SCALING IN HIGH-TEMPERATURE SUPERCONDUCTORS
    RUVALDS, J
    RIECK, CT
    ZHANG, J
    VIROSZTEK, A
    SCIENCE, 1992, 256 (5064) : 1664 - 1667
  • [22] A universal scaling relation in high-temperature superconductors
    C. C. Homes
    S. V. Dordevic
    M. Strongin
    D. A. Bonn
    Ruixing Liang
    W. N. Hardy
    Seiki Komiya
    Yoichi Ando
    G. Yu
    N. Kaneko
    X. Zhao
    M. Greven
    D. N. Basov
    T. Timusk
    Nature, 2004, 430 : 539 - 541
  • [23] Universal scaling behavior of the c-axis resistivity of high-temperature superconductors
    Su, YH
    Luo, HG
    Xiang, T
    PHYSICAL REVIEW B, 2006, 73 (13):
  • [24] TRANSIENT MOMENT RELAXATION IN HIGH-TEMPERATURE SUPERCONDUCTORS
    XUE, YY
    GAO, L
    REN, YT
    CHAN, WC
    HOR, PH
    CHU, CW
    PHYSICAL REVIEW B, 1991, 44 (21): : 12029 - 12032
  • [25] Magnetic-field fluctuations and the NQR relaxation rate in high-temperature superconductors
    Timm, C
    CZECHOSLOVAK JOURNAL OF PHYSICS, 1996, 46 : 1789 - 1790
  • [26] MAGNETIC INSTABILITIES IN HIGH-TEMPERATURE SUPERCONDUCTORS
    GERBER, A
    TARNAWSKI, Z
    FRANSE, JJM
    PHYSICA C-SUPERCONDUCTIVITY AND ITS APPLICATIONS, 1993, 209 (1-3): : 147 - 150
  • [27] Superionic behavior of high-temperature superconductors
    Phys Rev B, 1 (89):
  • [28] Superionic behavior of high-temperature superconductors
    Rakitin, A
    Kobayashi, M
    Litvinchuk, AP
    PHYSICAL REVIEW B, 1997, 55 (01) : 89 - 92
  • [29] Scaling structure of magnetization anomalies in high-temperature superconductors
    Univ of Bahrain, Bahrain
    J Phys D, 1 (20-24):
  • [30] Scaling structure of magnetization anomalies in high-temperature superconductors
    Khalil, AE
    JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1996, 29 (01) : 20 - 24
12345