Modulated photothermal reflectance on porous silicon

被引：0
|
作者：
Instituto Elettrotecnico Nazionale, Galileo Ferraris, Torino, Italy [1 ]
机构：
来源：
Thin Solid Films | / 1-2卷 / 111-114期
关键词：
D O I：
暂无
中图分类号：
学科分类号：
摘要：
引用
收藏
相关论文
共 50 条
  • [21] Photothermal investigation study of porous silicon layer doped lithium
    Ktifa, S.
    Haddadi, I.
    Saadallah, F.
    Ezzaouia, H.
    Yacoubi, N.
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2013, 110 (01): : 157 - 161
  • [22] Photothermal investigation study of porous silicon layer doped lithium
    S. Ktifa
    I. Haddadi
    F. Saadallah
    H. Ezzaouia
    N. Yacoubi
    Applied Physics A, 2013, 110 : 157 - 161
  • [23] Determination of thermophysical parameters of porous silicon using a photothermal technique
    Abdalla, S
    Easawi, K
    Negm, S
    Youssef, GM
    El-Brolossy, TA
    Talaat, H
    REVIEW OF SCIENTIFIC INSTRUMENTS, 2003, 74 (01): : 848 - 850
  • [24] Features of photothermal transformation in porous silicon based multilayered structures
    Dubyk, K.
    Chepela, L.
    Lishchuk, P.
    Belarouci, A.
    Lacroix, D.
    Isaiev, M.
    APPLIED PHYSICS LETTERS, 2019, 115 (02)
  • [25] CORRELATION OF MODULATED OPTICAL REFLECTANCE WITH SILICON CARRIER LIFETIME AND IMPURITY CONCENTRATION
    ROZGONYI, GA
    RADZIMSKI, ZJ
    KOLA, RR
    SMITH, WL
    BIVAS, A
    APPLIED PHYSICS LETTERS, 1990, 56 (12) : 1169 - 1171
  • [26] Nonlinear photothermal modulated optical reflectance and photocurrent phenomena in crystalline semiconductors .1. Theoretical
    Wagner, RE
    Mandelis, A
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (03) : 289 - 299
  • [27] Nonlinear photothermal modulated optical reflectance and photocurrent phenomena in crystalline semiconductors .2. Experimental
    Wagner, RE
    Mandelis, A
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1996, 11 (03) : 300 - 307
  • [28] Nonlinear photothermal modulated optical reflectance and photocurrent phenomena in crystalline semiconductors: II. Experimental
    Univ of Toronto, Toronto, Canada
    Semicond Sci Technol, 3 (300-307):
  • [29] Biased MOS-FET and polycrystalline silicon tracks investigated by photothermal reflectance microscopy
    Batista, JA
    Mansanares, AM
    Fournier, D
    9TH INTERNATIONAL CONFERENCE ON PHOTOACOUSTIC AND PHOTOTHERMAL PHENOMENA, CONFERENCE DIGEST, 1996, : 468 - 469
  • [30] Photothermal Investigation of Nanocomposite Porous Silicon / Rhodamine 6G
    Ktifa, S.
    Znaidi, M.
    Saadallah, F.
    Yacoubi, N.
    Ezzaouia, H.
    SILICON, 2018, 10 (04) : 1573 - 1577
12345