How Are LSI Components for Telecommunication Systems Tested.

被引：0
|
作者：
Giesbrecht, Dieter
Mahoney, Matthew
机构：
来源：
Elektronik Munchen | 1981年 / 30卷 / 06期
关键词：
INTEGRATED CIRCUITS - Very Large Scale Integration;
D O I：
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中图分类号：
学科分类号：
摘要：
Testing of VLSI components for telecommunication systems demands special procedures. Problems that arise during testing of this kind of components are discussed. By means of examples, it is shown how to solve them.
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页码：113 / 117
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