Carbon nanotubes films: electronic properties and their application as field emitters

被引:0
|
作者
De, Heer, W. A.
Bonard, J.-M.
Stoeckli, T.
Chatelain, A.
机构
来源
Zeitschrift fuer Physik D: Atoms, Molecules and Clusters | / 40卷 / 01期
关键词
D O I
暂无
中图分类号
学科分类号
摘要
引用
收藏
相关论文
共 50 条
  • [31] Electronic properties of aligned carbon nanotubes
    Chauvet, O
    Forro, L
    Zuppiroli, L
    DeHeer, WA
    SYNTHETIC METALS, 1997, 86 (1-3) : 2311 - 2312
  • [32] The electronic properties of chiral carbon nanotubes
    Liu, Jing
    Lu, Junzhe
    Lin, Xiang
    Tang, Yuchao
    Liu, Yanan
    Wang, Ting
    Zhu, Hengjiang
    COMPUTATIONAL MATERIALS SCIENCE, 2017, 129 : 290 - 294
  • [33] ELECTRONIC AND LATTICE PROPERTIES OF CARBON NANOTUBES
    JISHI, RA
    INOMATA, D
    NAKAO, K
    DRESSELHAUS, MS
    DRESSELHAUS, G
    JOURNAL OF THE PHYSICAL SOCIETY OF JAPAN, 1994, 63 (06) : 2252 - 2260
  • [34] Structural and electronic properties of carbon nanotubes
    Erkoç, S
    INTERNATIONAL JOURNAL OF MODERN PHYSICS C, 2000, 11 (01): : 175 - 182
  • [35] Electronic properties of carbon nanotubes with defects
    Prylutskyy, YI
    Ogloblya, OV
    Eklund, PC
    Scharff, P
    SYNTHETIC METALS, 2001, 121 (1-3) : 1209 - 1210
  • [36] Electronic properties of carbon nanotubes and graphene
    Brus, Louis
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2012, 244
  • [37] Structure and electronic properties of carbon nanotubes
    Odom, TW
    Huang, JL
    Kim, P
    Lieber, CM
    JOURNAL OF PHYSICAL CHEMISTRY B, 2000, 104 (13): : 2794 - 2809
  • [38] The electronic properties of graphene and carbon nanotubes
    Tsuneya Ando
    NPG Asia Materials, 2009, 1 : 17 - 21
  • [39] Electronic Properties of Defects in Carbon Nanotubes
    Mykhailova, H. Yu
    Nischenko, M. M.
    Prikhodko, G. P.
    Anikeev, V. V.
    Koda, V. Yu
    NANOOPTICS, NANOPHOTONICS, NANOSTRUCTURES, AND THEIR APPLICATIONS, NANO2017, 2018, 210 : 175 - 182
  • [40] Electronic properties of oxidized carbon nanotubes
    Jhi, SH
    Louie, SG
    Cohen, ML
    PHYSICAL REVIEW LETTERS, 2000, 85 (08) : 1710 - 1713