Radiation induced structural changes in amorphous SiO2: I. Point defects

被引：0
|
作者：
Devine, R.A.B. [1 ]
机构：
[1] Cent Natl d'Etudes des, Telecommunications, Meylan, France
来源：
Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers | 1992年 / 31卷 / 12 B期
关键词：
Radiation damage;
D O I：
10.1143/jjap.31.4411
中图分类号：
学科分类号：
摘要：
引用
收藏
页码：4411 / 4421
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