Interface roughness scattering in thin quantum wells

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机构：
[1] Elhamri, S.
[2] Ahoujja, M.
[3] Hudgins, R.
[4] Mast, D.B.
[5] Newrock, R.S.
[6] Mitchel, W.C.
[7] Razeghi, M.
[8] Erdtmann, M.
来源：
Elhamri, S. | 1600年 / Academic Press Ltd, London, United Kingdom卷 / 18期
关键词：
Semiconductor quantum wells;
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