DEPTH PROFILING OF Cu-Cr MULTILAYER STRUCTURES.

被引:0
|
作者
Laszlo, J. [1 ]
Marton, D. [1 ]
Giber, J. [1 ]
机构
[1] Technical Univ of Budapest, Budapest, Hung, Technical Univ of Budapest, Budapest, Hung
关键词
D O I
暂无
中图分类号
学科分类号
摘要
METALS AND ALLOYS
引用
收藏
页码:662 / 665
相关论文
共 50 条
  • [41] AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILING OF METAL/OXIDE MULTILAYER STRUCTURES
    ZALAR, A
    HOFMANN, S
    PANJAN, P
    THIN SOLID FILMS, 1991, 206 (1-2) : 327 - 329
  • [42] REDEPOSITION IN AES SPUTTER DEPTH PROFILING OF MULTILAYER CR/NI THIN-FILMS
    ZALAR, A
    HOFMANN, S
    SURFACE AND INTERFACE ANALYSIS, 1988, 12 (1-12) : 83 - 86
  • [43] Spinodal decomposition and precipitation in Cu-Cr nanocomposite
    Sheibani, S.
    Heshmati-Manesh, S.
    Ataie, A.
    Caballero, A.
    Criado, J. M.
    JOURNAL OF ALLOYS AND COMPOUNDS, 2014, 587 : 670 - 676
  • [44] DOUBLY BOTTLENECKED EPR IN CU-CR,MN
    HIRST, LL
    SCHAFER, W
    SEIPLER, D
    ELSCHNER, B
    PHYSICAL REVIEW B, 1973, 8 (01): : 64 - 69
  • [45] AUGER SPUTTER DEPTH PROFILING ANALYSIS OF NI/CR MULTILAYER THIN-FILM
    OGIWARA, T
    TANUMA, S
    BUNSEKI KAGAKU, 1992, 41 (12) : T157 - T161
  • [46] Comparative study on hot rolling of Cu-Cr and Cu-Cr-CNT nanocomposites
    Hamedan, S. Shakib
    Abdi, M.
    Sheibani, S.
    TRANSACTIONS OF NONFERROUS METALS SOCIETY OF CHINA, 2018, 28 (10) : 2044 - 2052
  • [47] Improving the mechanical performance of Cu-Cr alloy by dissolving Cu in the Cr second phase
    Shan, Liyuan
    Wang, Xueliang
    Chang, Yanli
    Wang, Yaping
    MATERIALS CHARACTERIZATION, 2021, 176
  • [48] Second Harmonic Generation from multilayer structures.
    Larciprete, M. C.
    Bovino, F. A.
    Centini, M.
    Belardini, A.
    Sibilia, C.
    Bertolotti, M.
    Passaseo, A.
    Tasco, V.
    2009 IEEE/LEOS WINTER TOPICALS MEETING SERIES (WTM 2009), 2009, : 164 - +
  • [49] COHERENT AND INCOHERENT REFLECTION AND TRANSMISSION OF MULTILAYER STRUCTURES.
    Harbecke, B.
    Applied physics. B, Photophysics and laser chemistry, 1986, B39 (03): : 165 - 170
  • [50] THICKNESS MEASUREMENT OF THIN FILMS IN MULTILAYER STRUCTURES.
    DiGiacomo, G.
    IBM Technical Disclosure Bulletin, 1974, 16 (11): : 3604 - 3605