CRYSTAL SPECTROMETER FOR MEASUREMENTS OF PIONIC X-RAYS.

被引：0

作者：

Beer, W. ^{[1
]}

Bos, K. ^{[1
]}

De Chambrier, G. ^{[1
]}

Giovanetti, K.L. ^{[1
]}

Goudsmit, P.F.A. ^{[1
]}

Grigoryev, B.V. ^{[1
]}

Jeckelmann, B. ^{[1
]}

Knecht, L. ^{[1
]}

Kondurova, L.N. ^{[1
]}

Langhans, J. ^{[1
]}

Leisi, H.J. ^{[1
]}

Levchenko, P.M. ^{[1
]}

Marushenko, V.I. ^{[1
]}

Mezentsev, A.F. ^{[1
]}

Obermeier, H. ^{[1
]}

机构：

[1] Eidgenoessiche Technische, Hochschule, Inst for Intermediate, Energy Physics, Villigen, Switz, Eidgenoessiche Technische Hochschule, Inst for Intermediate Energy Physics, Villigen, Switz

来源：

Nuclear instruments and methods in physics research | 1985年 / A238卷 / 2-3期

关键词：

X-RAYS; -; Measurements;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

A description is given of a bent-crystal spectrometer for pionic X-rays. The instrument is of the modified DuMond type and makes use of a combined pi -production-X-ray target. It is situated in a 20 mu A, 590 MeV proton beam at SIN. Combination of high mechanical precision and a laser interferometer system makes it possible to measure wavelength ratios with a precision of 1-2 parts per million.

引用

页码：365 / 380

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