CRYSTAL SPECTROMETER FOR MEASUREMENTS OF PIONIC X-RAYS.

被引：0

作者：

Beer, W. ^{[1
]}

Bos, K. ^{[1
]}

De Chambrier, G. ^{[1
]}

Giovanetti, K.L. ^{[1
]}

Goudsmit, P.F.A. ^{[1
]}

Grigoryev, B.V. ^{[1
]}

Jeckelmann, B. ^{[1
]}

Knecht, L. ^{[1
]}

Kondurova, L.N. ^{[1
]}

Langhans, J. ^{[1
]}

Leisi, H.J. ^{[1
]}

Levchenko, P.M. ^{[1
]}

Marushenko, V.I. ^{[1
]}

Mezentsev, A.F. ^{[1
]}

Obermeier, H. ^{[1
]}

机构：

[1] Eidgenoessiche Technische, Hochschule, Inst for Intermediate, Energy Physics, Villigen, Switz, Eidgenoessiche Technische Hochschule, Inst for Intermediate Energy Physics, Villigen, Switz

来源：

Nuclear instruments and methods in physics research | 1985年 / A238卷 / 2-3期

关键词：

X-RAYS; -; Measurements;

D O I：

暂无

中图分类号：

学科分类号：

摘要：

A description is given of a bent-crystal spectrometer for pionic X-rays. The instrument is of the modified DuMond type and makes use of a combined pi -production-X-ray target. It is situated in a 20 mu A, 590 MeV proton beam at SIN. Combination of high mechanical precision and a laser interferometer system makes it possible to measure wavelength ratios with a precision of 1-2 parts per million.

引用

页码：365 / 380

共 50 条

[1] CRYSTAL SPECTROMETER FOR MEASUREMENTS OF PIONIC X-RAYS
BEER, W
BOS, K
DECHAMBRIER, G
GIOVANETTI, KL
GOUDSMIT, PFA
GRIGORYEV, BV
JECKELMANN, B
KNECHT, L
KONDUROVA, LN
LANGHANS, J
LEISI, HJ
LEVCHENKO, PM
MARUSHENKO, VI
MEZENTSEV, AF
OBERMEIER, H
PETRUNIN, AA
ROHRER, U
SERGEEV, AG
SKORNJAKOV, SG
SMIRNOV, AI
STEINER, E
STRASSNER, G
SUVOROV, VM
VACCHI, A
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1985, 238 (2-3): : 365 - 380
[2] A BENT-CRYSTAL SPECTROMETER FOR PRECISION-MEASUREMENTS OF PIONIC X-RAYS
BEER, W
BOS, K
DECHAMBRIER, G
GOUDSMIT, PFA
KNECHT, L
KONDUROVA, LN
LEISI, HJ
LEVCHENKO, PM
MARUSHENKO, VI
MEZENTSEV, AF
PETRUNIN, AA
RUCKSTUHL, W
SCHWITZ, W
SERGEEV, AG
SKORNJAKOV, SG
SMIRNOV, AI
STRASSNER, G
SUVOROV, VM
VACCHI, A
HELVETICA PHYSICA ACTA, 1981, 54 (04): : 643 - 643
[3] NEW PIONIC MASS MEASUREMENT FROM PIONIC X-RAYS USING A BENT CRYSTAL SPECTROMETER
LU, D
DELKER, L
DUGAN, G
WU, CS
CAFFREY, A
CHENG, T
LEE, YK
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1978, 23 (07): : 928 - 928
[4] Crystal research with x-rays.
von Laue, M
BERICHTE DER DEUTSCHEN CHEMISCHEN GESELLSCHAFT, 1917, 50 : 8 - 20
[5] Notice on the energy measurements of x-rays.
Leininger, F
PHYSIKALISCHE ZEITSCHRIFT, 1900, 2 : 691 - 693
[6] Measurements of the coefficients of absorption of x-rays.
Devaux, J
Guinier, A
COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES, 1944, 218 : 318 - 320
[7] Investigations on crystal optics of X-rays.
Ehrenberg, W
Ewald, PP
Mark, H
ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1928, 66 (5/6): : 547 - 584
[8] MEASUREMENTS OF PIONIC X-RAYS IN NICKEL
JENKINS, D
POWERS, R
MILLER, G
BULLETIN OF THE AMERICAN PHYSICAL SOCIETY, 1968, 13 (12): : 1726 - &
[9] DETERMINATION OF STRONG-INTERACTION WIDTHS AND SHIFTS OF PIONIC X-RAYS WITH A CRYSTAL SPECTROMETER
BOEHM, F
HAHN, A
HENRIKSON, HE
MILLER, J
POWERS, RJ
VOGEL, P
VUILLEUMIER, JL
WANG, KC
PHYSICAL REVIEW LETTERS, 1977, 38 (05) : 215 - 218
[10] RESIDUAL STRESSES IN MATERIALS AND THEIR MEASUREMENTS BY X-RAYS.
Pathiraj, V.
Vasudevan, R.
TISCO (Tata Iron and Steel Co), 1977, 24 (03): : 109 - 120

← 1 2 3 4 5 →