TESTING STRATEGY AND TECHNIQUE FOR MACRO-BASED CIRCUITS.

被引：0

作者：

Somenzi, Fabio ^{[1
]}

Gai, Silvano ^{[1
]}

Mezzalama, Marco ^{[1
]}

Prinetto, Paolo ^{[1
]}

机构：

[1] Sgs Ates Componenti Elettronici S., p. A. , Brianza, Italy, Sgs Ates Componenti Elettronici S. p. A. , Brianza, Italy

来源：

IEEE Transactions on Computers | 1985年 / C-34卷 / 01期

关键词：

D O I：

暂无

中图分类号：

学科分类号：

摘要：

INTEGRATED CIRCUITS, VLSI

引用

页码：85 / 90

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