Testing LSI components

被引：0
|
作者：
Görke, W. [1 ]
机构：
[1] Institut für Informatik IV, Universität Karlsruhe, Germany
来源：
IT - Information Technology | 1978年 / 20卷 / 1-6期
关键词：
LSI circuits;
D O I：
10.1524/itit.1978.20.16.220
中图分类号：
TN3 [半导体技术]; TN4 [微电子学、集成电路（IC）];
学科分类号：
0805 ; 080501 ; 080502 ; 080903 ; 1401 ;
摘要：
Based on the approaches for testing LSI components reported so far their problems and possibilities are being discussed. Since often the internal circuit structure of these components is not available to the user, functional test procedures must be used despite of their disadvantages. For the 8080 microprocessor such a functional test is being developed. For memory components the purpose of these functional tests consists in checking their behavior against data pattern sensitivities. © 1978 De Gruyter Oldenbourg. All rights reserved.
引用
收藏
页码：220 / 229
相关论文
共 50 条
12345