STABILITY AND NOISE IMPROVEMENT IN REFLECTOMETRIC INDEX MEASUREMENT.

被引：0
|
作者：
Calzavara, Massimo
Costa, Bruno
Sordo, Bruno
机构：
来源：
CSELT Rapporti Tecnici (Centro Studi e Laboratori Telecomunicazioni) | 1981年 / 9卷 / 02期
关键词：
Compendex;
D O I：
暂无
中图分类号：
学科分类号：
摘要：
FIBER OPTICS
引用
收藏
页码：167 / 168
相关论文
共 50 条
  • [41] Systems of electrical measurement.
    Smith, FE
    PROCEEDINGS OF THE PHYSICAL SOCIETY OF LONDON, 1925, 37 : 101 - 115
  • [42] CARRIER MOBILITY MEASUREMENT.
    Yoshino, K.
    IEEE transactions on electrical insulation, 1986, EI-21 (06): : 999 - 1006
  • [43] SURVEY OF TEMPERATURE MEASUREMENT.
    Saltvold, J.R.
    Atomic Energy of Canada Limited, AECL (Report), 1976, (5394):
  • [44] Surface Roughness Measurement.
    Burow, Guenter
    Werkstatt und Betrieb, 1980, 113 (05): : 339 - 343
  • [45] SHORE TANK MEASUREMENT.
    Kelly, F.
    Petroleum Review, 1987, 41 (490): : 30 - 33
  • [46] Reflectometric measurement of plasma imaging and applications
    Mase, A.
    Ito, N.
    Oda, M.
    Komada, Y.
    Nagae, D.
    Zhang, D.
    Kogi, Y.
    Tobimatsu, S.
    Maruyama, T.
    Shimazu, H.
    Sakata, E.
    Sakai, F.
    Kuwahara, D.
    Yoshinaga, T.
    Tokuzawa, T.
    Nagayama, Y.
    Kawahata, K.
    Yamaguchi, S.
    Tsuji-lio, S.
    Domier, C. W.
    Luhmann, N. C., Jr.
    Park, H. K.
    Yun, G.
    Lee, W.
    Padhi, S.
    Kim, K. W.
    JOURNAL OF INSTRUMENTATION, 2012, 7
  • [47] SURFACE TEXTURE MEASUREMENT.
    Harvie, A.
    Beattie, J.S.
    1978, 57 (02): : 25 - 29
  • [48] CAPACITANCE FOR LEVEL MEASUREMENT.
    Endress & Hauser, Manchester, Engl, Endress & Hauser, Manchester, Engl
    Meas Control, 1988, 1 (15-19):
  • [49] CHIP TEMPERATURE MEASUREMENT.
    Jung, E.
    Klein, W.
    Najmann, K.
    Richter, S.
    IBM technical disclosure bulletin, 1984, 27 (4 B): : 2421 - 2422
  • [50] Acoustic detachment measurement.
    不详
    NATURWISSENSCHAFTEN, 1920, 8 : 135 - 138
12345